Intel® 700 Series Chipset Family On-Package Platform Controller Hub (PCH)
Datasheet, Volume 1 of 2
Signal Description
Signal Name | Type | Description |
---|---|---|
JTAG Signals | ||
PCH_JTAG_TCK | I/O | Test Clock Input (TCK): The test clock input provides the clock for the JTAG test logic. |
PCH_JTAG_TMS | I/OD | Test Mode Select (TMS): The signal is decoded by the Test Access Port (TAP) controller to control test operations. |
PCH_JTAG_TDI | I/OD | Test Data Input (TDI): Serial test instructions and data are received by the test logic at TDI. |
PCH_JTAG_TDO | I/OD | Test Data Output (TDO): TDO is the serial output for test instructions and data from the test logic defined in this standard. |
PCH_JTAGX | I/O | This pin is used to support merged debug port topologies. |
DBG_PMODE | O | ITP Power Mode Indicator. This signal is used to transmit processor and PCH power/reset information to the Debugger. |
Boundry Scan Sideband Signals | ||
GPP_E19 / DDP1_CTRLDATA / TBT_LSX0_RXD / BSSB_LS0_TX | I/O | |
GPP_E18 / DDP1_CTRLCLK / TBT_LSX0_TXD / BSSB_LS0_RX | I/O | |
GPP_E21 / DDP2_CTRLDATA / TBT_LSX1_RXD / BSSB_LS1_TX | I/O | |
GPP_E20 / DDP2_CTRLCLK / TBT_LSX1_TXD / BSSB_LS1_RX | I/O | |
GPP_D10 / ISH_SPI_CLK / DDP3_CTRLDATA / TBT_LSX2_RXD / BSSB_LS2_TX / GSPI2_CLK | O | |
GPP_D9 / ISH_SPI_CS# / DDP3_CTRLCLK / TBT_LSX2_TXD / BSSB_LS2_RX / GSPI2_CS0# | I | |
GPP_D12 / ISH_SPI_MOSI / DDP4_CTRLDATA / TBT_LSX3_RXD / BSSB_LS3_TX / GSPI2_MOSI | O | |
GPP_D11 / ISH_SPI_MISO / DDP4_CTRLCLK / TBT_LSX3_TXD / BSSB_LS3_RX / GSPI2_MISO | I |