Intel® Core™ Ultra 200S, Intel® Core™ Ultra 200S Plus ,Intel® Core™ Ultra 200HX and 200HX Plus Series Processors

Datasheet, Volume 1 of 2

ID Date Version Classification
832586 03/17/2026 Public
Document Table of Contents
LAM

Testability and Monitoring

This section contains information regarding the testability signals that provides access to JTAG, run control, system control, and observation resources.

Acronyms

Acronyms

Description

BSDL Boundary Scan Description Language
DCI Direct Connect Interface
DbC Debug Class Devices
DFP Downward Facing Port, USB Type-C term
IEEE Institute of Electrical and Electronics Engineers
I/O Input/Output
I/OD Input/Output Open Drain
Intel® TH Intel® Trace Hub
JTAG Joint Test Action Group
KMD Kernel Mode Debug
UFP Upstream Facing Port, USB Type-C term
2W 2-Wire

References

Specification

Document Number/Location

Specification IEEE Standard Test Access Port and Boundary Scan Architecture

http://standards.ieee.org/findstds/standard/1149.1-2013.html