Intel® 800 Series Chipset Family Platform Controller Hub (PCH)

Datasheet, Volume 1 of 2

ID Date Version Classification
833778 02/06/2025 Public
Document Table of Contents

Testability and Monitoring

This section contains information regarding the testability signals that provides access to JTAG, run control, system control, and observation resources.

Acronyms

Acronyms

Description

BSDL Boundary Scan Description Language
DCI Direct Connect Interface
IEEE Institute of Electrical and Electronics Engineers
I/O Input/Output
I/OD Input/Output Open Drain
Intel® TH Intel® Trace Hub
JTAG Joint Test Action Group

References

Specification

Document Number/Location

Specification IEEE Standard Test Access Port and Boundary Scan Architecture

http://standards.ieee.org/findstds/standard/1149.1-2013.html