Intel® Core™ Ultra 200V Series Processors

Datasheet, Volume 1 of 2

ID Date Version Classification
829568 05/27/2025 004 Confidential
Document Table of Contents

Testability and Monitoring

This section contains information regarding the testability signals that provides access to JTAG, run control, system control, and observation resources.

Acronyms

Acronyms

Description

BPK Baltic Peak
BSDL Boundary Scan Description Language
DCI Direct Connect Interface
DbC Debug Class Devices
DFP Downward Facing Port, USB Type-C term
IEEE Institute of Electrical and Electronics Engineers
I/O Input/Output
I/OD Input/Output Open Drain
Intel® MFIT Intel® Flash Image Tool, Intel Tool
Intel® TH Intel® Trace Hub
JTAG Joint Test Action Group
KMD Kernel* Mode Debug
UFP Upstream Facing Port, USB Type-C term
2W 2-Wire