Intel® Core™ Ultra 200H and 200U Series Processors

Datasheet, Volume 1 of 2

ID Date Version Classification
842704 05/27/2025 Public
Document Table of Contents

Testability and Monitoring

This section contains information regarding the testability signals that provides access to JTAG, run control, system control, and observation resources.

Acronyms

Acronyms

Description

BPK Baltic Peak
BSDL Boundary Scan Description Language
DCI Direct Connect Interface
DbC Debug Class Devices
DFP Downward Facing Port, USB Type-C term
2W 2-Wire
IEEE Institute of Electrical and Electronics Engineers
I/O Input/Output
I/OD Input/Output Open Drain
Intel® TH Intel® Trace Hub
JTAG Joint Test Action Group
UFP Upstream Facing Port, USB Type-C term

References

Specification

Document Number/Location

Specification IEEE Standard Test Access Port and Boundary Scan Architecture

http://standards.ieee.org/findstds/standard/1149.1-2013.html