Intel® Pentium® Silver and Intel® Celeron® Processors Datasheet, Volume 1

Datasheet

ID Date Version Classification
633935 17/06/2021 00:00:00 Public Content

A newer version of this document is available. Customers should click here to go to the newest version.

Document Table of Contents
DSP

Testability

This chapter provides information regarding testability of on the following topics:

Intel® Processor Trace

Intel® Processor Trace (Intel® PT) is a tracing capability added to Intel® Architecture, for use in software debug and profiling. Intel® PT provides the capability for precise software control flow and timing information, with limited impact to software execution. This provides enhanced ability to debug software crashes, hangs, or other anomalies, as well as responsiveness and short-duration performance issues. Refer to the Intel® 64 Architectures Software Developer’s Manual, for more information: https://www.intel.com/content/www/us/en/products/processors.html/manuals.

Note:Intel® Processor Trace uses CFG bus.

JTAG

This provides information regarding the testability signals that provides access to JTAG, run control, system control, and observation resources. JTAG (TAP) ports are compatible with the IEEE Standard Test Access Port and Boundary Scan Architecture 1149.1 and 1149.6 Specification, as detailed per device in each BSDL file. JTAG Pin definitions are from IEEE Standard Test Access Port and Boundary Scan. Architecture (IEEE Std. 1149.1-2001).

Intel® Trace Hub

Intel® Trace Hub is a debug architecture that unifies hardware and software system visibility. Intel® Trace Hub is not merely intended for hardware debug or software debug, but full system debug. This includes debugging hardware and software as they interact and produce complex system behavior. Intel® Trace Hub defines new features and also leverages some existing debug technologies to provide a complete framework for hardware and software co-debug, software development and tuning, as well as overall system performance optimization.

Intel® Trace Hub is a set of silicon features with supported software API. The primary purpose is to collect trace data from different sources in the system and combine them into a single output stream with time-correlated to each other. Intel® Trace Hub uses common hardware interface for collecting time-correlated system traces through standard destinations. Intel® Trace Hub adopts industry standard (MIPI* STPv2) debug methodology for system debug and software development.

There are multiple destinations to receive the trace data from Intel® Trace Hub:

  • Direct Connect Interface (DCI)
    • OOB Hosting DCI
    • USB 2.0 and USB 3.2 hosting DCI.DBC
  • System Memory

There are multiple trace sources planned to be supported in the platform:

  • BIOS
  • Intel® CSE
  • AET (Architecture Event Trace)
  • Power Management Event Trace
  • Windows* ETW (for driver or application)

Acronyms

Acronyms

Description

IEEE

Institute of Electrical and Electronics Engineers

I/O

Input/Output

I/OD

Input/Output Open Drain

JTAG

Joint Test Action Group

DCI

Direct Connect Interface

BSDL

Boundary Scan Description Language

DbC

Debug Class Devices

References

Specification

Location

IEEE Standard Test Access Port and Boundary Scan Architecture

http://standards.ieee.org/findstds/standard/1149.1-2013.html